Sensitivity of output response to geometrical dimensions in VLSI interconnects

Agnieszka Ligocka-Wardzinska, W. Bandurski
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引用次数: 2

Abstract

The paper presents a sensitivity analysis of step and ramp response of VLSI interconnects to geometrical dimensions of microstrip model of higher level interconnects. The method is based on analytical form of VLSI output response calculated using multiple scales method.
VLSI互连中输出响应对几何尺寸的敏感性
本文分析了超大规模集成电路互连的阶跃和斜坡响应对高电平互连微带模型几何尺寸的敏感性。该方法基于超大规模集成电路输出响应的解析形式,采用多尺度法计算。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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