Fast Automatic Artifact Annotator for EEG Signals Using Deep Learning

D. Kim, S. Keene
{"title":"Fast Automatic Artifact Annotator for EEG Signals Using Deep Learning","authors":"D. Kim, S. Keene","doi":"10.1109/SPMB47826.2019.9037834","DOIUrl":null,"url":null,"abstract":"Electroencephalogram (EEG) is a widely used non-invasive brain signal acquisition technique that measures voltage fluctuations from neuron activities of the brain. EEGs are typically used to diagnose and monitor disorders such as epilepsy, sleep disorders, and brain death and also to help the advancement of various fields of science such as cognitive science, and psychology. EEG signals usually suffer from a variety of artifacts caused by eye movements, chewing, muscle movements, and electrode pops, which disrupts the diagnosis and hinders precise representation of brain activities. This paper proposes a deep learning based model to detect the presence of the artifacts and to classify the kind of the artifact to help clinicians resolve problems regarding artifacts immediately during the signal collection process. The model is optimized to map the 1-second segments of raw EEG signals to detect 4 different kinds of artifacts and the real signal. The model achieves a 5-class classification accuracy of 67.59%, and a true positive rate of 80% with a 25.82% false alarm for binary artifact classification with time-lapse. The model is lightweight and could potentially be deployed in portable machines.","PeriodicalId":143197,"journal":{"name":"2019 IEEE Signal Processing in Medicine and Biology Symposium (SPMB)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2019-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE Signal Processing in Medicine and Biology Symposium (SPMB)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SPMB47826.2019.9037834","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8

Abstract

Electroencephalogram (EEG) is a widely used non-invasive brain signal acquisition technique that measures voltage fluctuations from neuron activities of the brain. EEGs are typically used to diagnose and monitor disorders such as epilepsy, sleep disorders, and brain death and also to help the advancement of various fields of science such as cognitive science, and psychology. EEG signals usually suffer from a variety of artifacts caused by eye movements, chewing, muscle movements, and electrode pops, which disrupts the diagnosis and hinders precise representation of brain activities. This paper proposes a deep learning based model to detect the presence of the artifacts and to classify the kind of the artifact to help clinicians resolve problems regarding artifacts immediately during the signal collection process. The model is optimized to map the 1-second segments of raw EEG signals to detect 4 different kinds of artifacts and the real signal. The model achieves a 5-class classification accuracy of 67.59%, and a true positive rate of 80% with a 25.82% false alarm for binary artifact classification with time-lapse. The model is lightweight and could potentially be deployed in portable machines.
基于深度学习的脑电信号快速自动伪影标注器
脑电图(EEG)是一种广泛使用的非侵入性脑信号采集技术,用于测量大脑神经元活动的电压波动。脑电图通常用于诊断和监测癫痫、睡眠障碍和脑死亡等疾病,也有助于促进认知科学和心理学等各个科学领域的发展。脑电图信号通常受到由眼球运动、咀嚼、肌肉运动和电极爆炸引起的各种伪影的影响,这扰乱了诊断并阻碍了大脑活动的精确表征。本文提出了一种基于深度学习的模型来检测伪影的存在并对伪影的类型进行分类,以帮助临床医生在信号收集过程中立即解决与伪影有关的问题。对该模型进行了优化,将原始脑电信号的1秒片段进行映射,以检测4种不同的伪影和真实信号。该模型的5类分类准确率为67.59%,真阳性率为80%,虚警率为25.82%。该模型很轻,有可能部署在便携式机器上。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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