A low-noise CMOS interface ASIC for capacitive MEMS accelerometer

Ying Wang, S. Gao, L. Shao, Yuntao Liu
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引用次数: 1

Abstract

A low noise interface application-specific integrated circuit (ASIC) for capacitive accelerometer is presented in this paper. A low-noise low-offset charge integrator is proposed to improve performance of the system. Correlated double sampling, closed-loop operational mode and PID controller are employed in this circuit to minimize the noise, offset and improve stability of the system. Meanwhile, by adding self-test circuit, it improves the reliability of the system. The AISC is fabricated in 0.5μm two-poly two-metal CMOS process, it operates under ± 5V supply with a power dissipation of 40mW. The tested results have shown that the noise floor of the accelerometer is 9.8μg/Hz1/2, the sensitivity is 1.32V/g, nonlinearity is 0.06% and the bias stability is 0.129mg.
一种用于电容式MEMS加速度计的低噪声CMOS接口ASIC
介绍了一种用于电容式加速度计的低噪声接口专用集成电路(ASIC)。为了提高系统的性能,提出了一种低噪声低偏置电荷积分器。该电路采用相关双采样、闭环工作模式和PID控制器,最大限度地减少了噪声和偏置,提高了系统的稳定性。同时,通过增加自检电路,提高了系统的可靠性。AISC采用0.5μm双聚双金属CMOS工艺制造,工作在±5V电源下,功耗为40mW。测试结果表明,该加速度计的本底噪声为9.8μg/Hz1/2,灵敏度为1.32V/g,非线性为0.06%,偏置稳定性为0.129mg。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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