{"title":"Molecular devices formed by direct monolayer attachment to silicon","authors":"C. Richter, C. Hacker, L. Richter","doi":"10.1109/ISDRS.2003.1272161","DOIUrl":null,"url":null,"abstract":"This paper presents the results of studies of solution-based attachment of long-chain aliphatic molecules to hydrogen-terminated Si surfaces to pursue the electrical properties of organic monolayers and as a first step towards creating hybrid silicon-molecular nanoelectronic devices. The effect of differing alkane chain length on the electrical properties were measured. To investigate the quality of the organic monolayers measured in these devices, they were physically and chemically characterized with infrared spectroscopy, spectroscopic ellipsometry, and contact angle measurement.","PeriodicalId":369241,"journal":{"name":"International Semiconductor Device Research Symposium, 2003","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"20","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Semiconductor Device Research Symposium, 2003","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISDRS.2003.1272161","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 20
Abstract
This paper presents the results of studies of solution-based attachment of long-chain aliphatic molecules to hydrogen-terminated Si surfaces to pursue the electrical properties of organic monolayers and as a first step towards creating hybrid silicon-molecular nanoelectronic devices. The effect of differing alkane chain length on the electrical properties were measured. To investigate the quality of the organic monolayers measured in these devices, they were physically and chemically characterized with infrared spectroscopy, spectroscopic ellipsometry, and contact angle measurement.