S. Lu, Chia-Hsien Li, Aanand, Syed Sarwar Imam, Shao-Ming Yang, Ming-Jen Fan, G. Sheu
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引用次数: 1
Abstract
In this paper, a normal nano-sensor technology using "top-down" poly-silicon nanowire field-effect transistors (FETs) in the conventional Complementary Metal-Oxide Semiconductor (CMOS)-compatible semiconductor process. The nanowire manufacturing technique reduced nanowire width scaling to 50 nm without use of extra lithography equipment, and exhibited superior device uniformity. These n type poly-silicon nanowire FETs have positive pH sensitivity (100 mV/pH) and sensitive deoxyribonucleic acid (DNA) detection ability (100 pM) at normal system operation voltages. Specially designed oxide-nitride buried oxide nanowire realizes drain saturation current (Ids) sensor to compensate device variation.