Detecting multiple symmetries with extended SIFT

Qian Chen, Haiyuan Wu, H. Taki
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引用次数: 0

Abstract

This paper describes an effective method for detecting multiple symmetric objects in an image. A “pseudo-affine invariant SIFT” is used for detecting symmetric feature pairs in perspective images. Candidates of symmetric axes are estimated from every two symmetric feature pairs, and the one supported by the most symmetric feature pairs is detected as the most relevant symmetric axis of a symmetric object. The symmetric feature pairs supporting the symmetric axis are then used to detect other symmetric axes in the same symmetric object. This procedure is applied repeatedly to the symmetric feature pairs after eliminating the ones that support the already detected symmetric axes to detect all symmetric objects in the image. The effectiveness of this method has been confirmed through several experiments using real images and common image databases.
扩展SIFT检测多重对称性
本文描述了一种检测图像中多个对称物体的有效方法。采用“伪仿射不变SIFT”检测透视图像中的对称特征对。从每两个对称特征对中估计对称轴的候选轴,并将最对称特征对支持的候选轴检测为对称对象的最相关对称轴。然后使用支持对称轴的对称特征对来检测同一对称对象中的其他对称轴。在去除支持已检测到的对称轴的对称特征对后,对对称特征对重复应用此过程,以检测图像中所有对称对象。通过实际图像和常用图像数据库的实验,验证了该方法的有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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