Scaling VCSEL reliability up to 250Terabits/s of system bandwidth

2005 OSA Topical Meeting on Information Photonics (IP) Pub Date : 2005-06-06 DOI:10.1364/IP.2005.ITHA3

J. Cunningham, D. Beckman, D. Mcelfresh, C. Forrest, D. Cohen, A. Krishnamoorthy

引用次数: 5

Abstract

We evaluate VCSEL reliability for next-generation High Productivity Computers in which several hundreds of terabits of bandwidth are envisioned. An empirical relationship for VCSEL scaling versus bit rate and aperture is presented in order to explore reliability of VCSEL-based links. Reliability is found to degrade with aperture with a fourth order power law dependence. VSCEL sparing, water-cooling and redundancy though percentage of link failures are analyzed.

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将VCSEL可靠性扩展到250tb /s的系统带宽

我们评估了下一代高生产力计算机的VCSEL可靠性，其中设想了数百太比特的带宽。为了探索基于VCSEL的链路的可靠性，提出了VCSEL缩放与比特率和孔径的经验关系。可靠性随着孔径的增大而降低，并具有四阶幂律依赖性。通过链路故障百分比分析了VSCEL节约、水冷和冗余。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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2005 OSA Topical Meeting on Information Photonics (IP)

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