Synthesis, structure, and optical properties of nanopowders CdS: xAl (x=0, 1, 5, 10, 15 and 20%) via the sol–gel technique

E. Assim
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引用次数: 1

Abstract

The nanocrystalline Al-doped CdS semiconductors were produced accurately by the sol-gel calcination process. The aluminum was added with different percent’s (0, 1, 5, 10, 15, and 20 wt%) to the synthesized CdS. Both FT-Raman analysis and UV–VIS-NIR absorption measurements were utilized to characterize the studied semiconductors' structural and optical characteristics. The detected X-ray diffraction (XRD) patterns of the prepared CdS present a polycrystalline structure, and Al-doping does not significantly impact this range. Optical bandgaps were determined for undoped and Al-doped CdS, showing a significant change with the percentage of Al-dopants. With increasing Al-doping up to (20 percent), the optical bandgap for CdS (2.38 eV) grows to reach (2.47 eV) and the allowed transitions were found to be direct for the investigated samples. The blue shift may be the reason for the optical bandgap variations. Scanning Electron Microscope (SEM) micrographs were performed to establish the Al-doped CdS nanostructure to identify the morphological characteristics.
溶胶-凝胶法制备CdS: xAl (x=0、1、5、10、15和20%)纳米粉体的合成、结构和光学性质
采用溶胶-凝胶煅烧法制备了掺杂铝的纳米晶CdS半导体材料。在合成的CdS中加入不同比例(0、1、5、10、15、20 wt%)的铝。利用FT-Raman分析和UV-VIS-NIR吸收测量来表征所研究的半导体的结构和光学特性。制备的CdS的x射线衍射(XRD)图显示为多晶结构,al掺杂对该范围没有显著影响。测定了未掺杂和掺杂al的CdS的光学带隙,发现随着al掺杂的比例的增加,光学带隙发生了显著的变化。随着al掺杂量的增加(20%),CdS的光学带隙(2.38 eV)增加到(2.47 eV),并且在所研究的样品中发现允许的跃迁是直接的。蓝移可能是光学带隙变化的原因。利用扫描电子显微镜(SEM)建立掺杂al的CdS纳米结构,并对其形貌特征进行鉴定。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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