C. Bertolini, André G. Farina, Paulo Fernandes, F. Oliveira
{"title":"Test case generation using stochastic automata networks: quantitative analysis","authors":"C. Bertolini, André G. Farina, Paulo Fernandes, F. Oliveira","doi":"10.1109/SEFM.2004.42","DOIUrl":null,"url":null,"abstract":"The software engineering community has been using Markov Chains (MC) to describe usage models. We have been working on the use of a more sophisticated discrete state formalism: Stochastic Automata Networks (SAN). SAN is a formalism with the same power of description as MC, however a system in SAN is described as a collection of subsystems described by local states, transitions and synchronizing events, allowing higher modularity and maintainability. We present a description of SAN formalism, as well as quantitative analysis of the modeling examples considering the generation time, quality of the test suites.","PeriodicalId":207271,"journal":{"name":"Proceedings of the Second International Conference on Software Engineering and Formal Methods, 2004. SEFM 2004.","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-09-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"19","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the Second International Conference on Software Engineering and Formal Methods, 2004. SEFM 2004.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SEFM.2004.42","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 19
Abstract
The software engineering community has been using Markov Chains (MC) to describe usage models. We have been working on the use of a more sophisticated discrete state formalism: Stochastic Automata Networks (SAN). SAN is a formalism with the same power of description as MC, however a system in SAN is described as a collection of subsystems described by local states, transitions and synchronizing events, allowing higher modularity and maintainability. We present a description of SAN formalism, as well as quantitative analysis of the modeling examples considering the generation time, quality of the test suites.