T. Makkonen, V. Plessky, S. Kondratiev, M. Salomaa
{"title":"Electromagnetic modeling of package parasitics in SAW-duplexer","authors":"T. Makkonen, V. Plessky, S. Kondratiev, M. Salomaa","doi":"10.1109/ULTSYM.1996.583777","DOIUrl":null,"url":null,"abstract":"We model the inductive and capacitive parasitic electromagnetic couplings in a packaged surface-acoustic wave (SAW) antenna duplexer. Theoretical estimates for self- and mutual inductances of the bond wires are computed in the presence of two ground planes. An equivalent circuit for the duplexer including the parasitic elements is presented. The frequency response of the duplexer is predicted with the help of circuit simulation. The modeling is further refined with optimization of the model parameters to improve the fit between the measured and simulated responses.","PeriodicalId":278111,"journal":{"name":"1996 IEEE Ultrasonics Symposium. Proceedings","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"20","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1996 IEEE Ultrasonics Symposium. Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ULTSYM.1996.583777","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 20
Abstract
We model the inductive and capacitive parasitic electromagnetic couplings in a packaged surface-acoustic wave (SAW) antenna duplexer. Theoretical estimates for self- and mutual inductances of the bond wires are computed in the presence of two ground planes. An equivalent circuit for the duplexer including the parasitic elements is presented. The frequency response of the duplexer is predicted with the help of circuit simulation. The modeling is further refined with optimization of the model parameters to improve the fit between the measured and simulated responses.