Selectively patterned masks: Beyond structured ASIC

Donkyu Baek, Insup Shin, Seungwhun Paik, Youngsoo Shin
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Abstract

Conventional structured ASIC still suffers from large delay and area due to the use of homogeneous array of tiles. We propose a new lithography method called selectively patterned masks (SPM), which enables more than one type of tiles to be used in structured ASIC. This structured ASIC using mixture of different tiles relaxes regularity. To assess SPM concept, A new structured ASIC is proposed; tile and routing architecture, and routing algorithm are all addressed. Experiment results using 45-nm technology show that proposed concept can push the limit of structured ASIC closer to traditional ASIC.
选择性图案掩模:超越结构化ASIC
传统的结构化ASIC由于使用均匀阵列芯片,仍然存在较大的延迟和面积问题。我们提出了一种新的光刻方法,称为选择性图案掩模(SPM),它可以在结构化ASIC中使用多种类型的瓦片。这种使用不同瓦片混合的结构化ASIC放松了规则性。为了评估SPM概念,提出了一种新的结构化ASIC;讨论了路由结构和路由算法。采用45纳米技术的实验结果表明,所提出的概念可以将结构化ASIC推向更接近传统ASIC的极限。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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