High Yield Mmic Design Using Improved Random Walk Approach

Abstract

~n tius parer, the traauonai ration! wa~ appmch fcr yield optmmtun IS mmfixi tc! fmhee-r mpmve its efficiency. ?lie or*&ogonai army rd experment desw 1s empioyed as an alternative tc generaw sample pmts m the crmt parameter space. In addluon the step of the random walK IS mafled to be a&pt. FmaUy, an exmpie IS even to show its efficiency.