Dual Power Gating 8-Transistor SRAM Design For Low Power Applications

Vo Minh Huan
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Abstract

As technology advances, manufacturers demand memory with low energy, high performance, and fast response SRAM (Static Random Access Memory). SRAM is a type of variable semiconductor memory that stores the binary logic digits '1' and '0'. The energy consumption of the circuit decreases as the voltage operation of the SRAM decreases, but the circuit's stability and performance suffer as the supply voltage decreases. Lower VDD increases SRAM cell latency while decreasing SRAM speed. Therefore, the study focuses on designing and implementing 6T and 8T SRAM circuits by comparing and evaluating hysteresis, energy, and margin parameters. The 6T SRAM is gated in both footer and header to save more energy. However, this low energy 6T SRAM has a small read margin. Leveraging high read margin characteristics of 8T SRAM, this paper does power gating on this type of 8T SRAM cell. By doing so, the proposed power gated 8T SRAM cell also saves energy but only keeps a high read margin. This simulation shows the leakage energy saving of the proposed 8T SRAM is up to 48% compared to that of 6T SRAM. The simulation result is performed in 130nm technology.
低功耗应用的双功率门控8晶体管SRAM设计
随着技术的进步,制造商要求内存具有低能耗,高性能和快速响应SRAM(静态随机存取存储器)。SRAM是一种存储二进制逻辑数字“1”和“0”的可变半导体存储器。电路的能量消耗随着SRAM电压工作的降低而降低,但电路的稳定性和性能会随着电源电压的降低而受到影响。较低的VDD增加了SRAM单元延迟,同时降低了SRAM速度。因此,研究重点是通过比较和评估迟滞、能量和裕度参数来设计和实现6T和8T SRAM电路。6T SRAM在页脚和页眉都是门控的,以节省更多的能量。然而,这种低能量的6T SRAM具有很小的读取余量。利用8T SRAM的高读裕度特性,本文对这种类型的8T SRAM单元进行功率门控。通过这样做,所提出的功率门控8T SRAM单元也节省能源,但只保持高读取余量。仿真结果表明,与6T SRAM相比,8T SRAM的泄漏节能高达48%。仿真结果在130nm工艺下进行。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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