{"title":"Rapid Trials-and-Errors Approach Based on Time-domain EMI Testing–a New Way to Speed up Product EMC Compliance","authors":"Wei Wu, Yuejia Wu","doi":"10.1109/MEEE57080.2023.10127024","DOIUrl":null,"url":null,"abstract":"Product EMC compliance processing is expensive and time-consuming. Rapid trials-and-errors approach is proposed in this paper to reduce the costs and shorten the time achieving product EMC compliance. The time-domain EMI testing technique can meet the fast-testing requirements of the approach, and a time-domain EMI testing system developed based on a general-purpose oscilloscope and Cloud Computing is presented to further meet the low-cost testing needs of the approach. The application case shows that by applying the proposed low-cost and fast-EMI-test system, engineers in manufacturing companies can reduce the EMI of EUT through frequent and rapid trials-and-errors in short time and low cost without EMC expertise.","PeriodicalId":168205,"journal":{"name":"2023 2nd International Conference on Mechatronics and Electrical Engineering (MEEE)","volume":"53 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-02-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 2nd International Conference on Mechatronics and Electrical Engineering (MEEE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MEEE57080.2023.10127024","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Product EMC compliance processing is expensive and time-consuming. Rapid trials-and-errors approach is proposed in this paper to reduce the costs and shorten the time achieving product EMC compliance. The time-domain EMI testing technique can meet the fast-testing requirements of the approach, and a time-domain EMI testing system developed based on a general-purpose oscilloscope and Cloud Computing is presented to further meet the low-cost testing needs of the approach. The application case shows that by applying the proposed low-cost and fast-EMI-test system, engineers in manufacturing companies can reduce the EMI of EUT through frequent and rapid trials-and-errors in short time and low cost without EMC expertise.