A multiline material parameter extraction method

Abstract

Material characterization is an important part of printable electronics design since material properties depend strongly on the manufacturing process. This paper introduces a novel multiline material characterization method that is applicable to the characterization of printable electronics structures as well as integrated microwave devices. The proposed technique eliminates the half-wave resonances, decrease the sensitivity to small variations in the lines and provide a weighted average from individual line pair data. The multiline extraction method is validated using full-wave simulation data, and is subsequently applied to test structures manufactured with inkjet technology.