Automatic synthesis of BISTed data paths from high level specification

Abstract

The incorporation of an on-line concurrent test method into high level synthesis of data-paths is addressed. Test vectors are propagated through all data-path resources during their idle times from built-in test patterns generators to response collectors. Testing is considered on the behavioral description. From the knowledge of resource idle times, a test flow graph is built up. Synthesis is then performed merging this graph and the normal control/data flow graph.<>