D. Jarrett, R. Elmquist, M. Kraft, G. Jones, S. Payagala, F. Seifert, D. Haddad, S. Schlamminger
{"title":"Quantum Hall resistance traceability for the NIST-4 watt balance","authors":"D. Jarrett, R. Elmquist, M. Kraft, G. Jones, S. Payagala, F. Seifert, D. Haddad, S. Schlamminger","doi":"10.1109/CPEM.2016.7540787","DOIUrl":null,"url":null,"abstract":"Scaling from the quantum Hall resistance to 100 Ω standard resistors used by the NIST-4 watt balance involves multiple resistance standards and bridges to provide the lowest possible uncertainty. Described here is the infrastructure and procedures developed to support these measurements at better than 20 × 10-9 standard uncertainty levels.","PeriodicalId":415488,"journal":{"name":"2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)","volume":"93 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-08-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CPEM.2016.7540787","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
Scaling from the quantum Hall resistance to 100 Ω standard resistors used by the NIST-4 watt balance involves multiple resistance standards and bridges to provide the lowest possible uncertainty. Described here is the infrastructure and procedures developed to support these measurements at better than 20 × 10-9 standard uncertainty levels.