A study of the current transport in AlGaAs/GaAs HBTs with graded and setback layers

C.S. Ho, D. Chen, A. Kager, J. Liou
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引用次数: 0

Abstract

The combined effects of graded and setback layers (W/sub G/ and W/sub I/) on the AlGaAs/GaAs heterojunction bipolar transistor (HBT) d.c. performance are investigated, and an analytical model which can describe the behavior of such HBTs is presented. The HBT base and collector currents accounting for the variation of the conduction and valence bands due to the presence of W/sub G/ and W/sub I/ are also calculated. It is shown that including W/sub G/ and W/sub I/ actually degrades the HBT current gain at low current levels. The current gain at high current levels, on the other hand, can be enhanced if W/sub I/=150 /spl Aring/ and 0/spl les/W/sub G//spl les/300 /spl Aring/ or W/sub I/=0 and 150 /spl Aring//spl les/W/sub G//spl les/300 /spl Aring/ are used. The model predictions compare favorably with results calculated from a numerical model.
具有渐变层和挫折层的AlGaAs/GaAs HBTs中电流输运的研究
研究了梯度层和挫折层(W/sub G/和W/sub I/)对AlGaAs/GaAs异质结双极晶体管(HBT)直流性能的综合影响,并提出了描述这种异质结双极晶体管性能的解析模型。还计算了由于W/sub G/和W/sub I/的存在而导致的导价带和价带变化的HBT基极和集电极电流。结果表明,在低电流水平下,加入W/sub G/和W/sub I/实际上会降低HBT电流增益。另一方面,如果使用W/sub I/=150 /spl Aring/和0/spl les/W/sub G//spl les/300 /spl Aring/或W/sub I/=0和150 /spl Aring//spl les/W/sub G//spl les/300 /spl Aring/,则可以增强高电流电平的电流增益。模型预测与数值模型计算的结果比较有利。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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