Bidimensional empirical mode decomposition for biometric analysis and Iris recognition

Abstract

A novel BEMD based Iris recognition system is presented. A multilayer processing for features extraction makes the system efficient. The use of geometrically described details information makes the iris signature very efficient in reducing false positive and false negatives occurrences. Preliminary results of the proposed algorithm seem to indicate BEMD can give high accuracy in iris recognition subsystems in comparison with other techniques.