Near field measurement system for the detection of electromagnetic field components radiated by microwave devices

M. A. Chahine, M. Khatib, A. Hamie, R. Perdriau, M. Ramdani
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引用次数: 5

Abstract

This paper presents a near field measurement system for the detection of all electromagnetic (EM) field components radiated by microwave devices. This characterization system based on the use of 4 semi-rigid coaxial probes (1 monopoly antenna, 1 differential dipole and 2 differential loops) and a controlled positioning system is power calibrated. It allows the localization of the radiation source in the RF integrated circuit (IC) and the measuring of the EM filed components amplitudes. The amplitude calibration is realized with a FR4 50 Ohms microstrip transmission line. The amplitude calibration of the system with performance factors for each probe is presented for the frequency range of [1MHz-1GHz]. A comparison between on the one hand, a 3D EM simulation of the entire probe with the standard and on the other side, the measure is presented.
近场测量系统用于检测微波器件辐射的电磁场分量
本文介绍了一种近场测量系统,用于检测微波器件辐射出的所有电磁场分量。该表征系统基于使用4个半刚性同轴探头(1个垄断天线,1个差分偶极子和2个差分环路)和一个受控定位系统进行功率校准。它可以定位射频集成电路(IC)中的辐射源,并测量电磁场分量的振幅。通过FR4 50欧姆微带传输线实现幅值校准。给出了在[1MHz-1GHz]频率范围内,利用各探头的性能因子对系统进行幅度标定。并对整个探头的三维仿真结果进行了比较,同时对测量结果进行了比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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