Fabrication and evaluation of piezoelectric drive type 2-axis tilt control device using epitaxial PZT thin film

K. Ozaki, D. Akai, K. Sawada, M. Ishida
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引用次数: 0

Abstract

Piezoelectric drive type 2-axis tilt control device using epitaxial Pb(Zr0.52, Ti0.48)O3 (PZT) thin film on epitaxial γ-Al2O3/Si substrate have been fabricated. A 500 nm-thick epitaxial PZT(111) thin film was sol-gel deposited on epitaxial SrRuO3(111)/Pt(111)/ γ-Al2O3(111)/Si(1 11) substrates, and hollow structure under actuate area was formed by XeF2 gas etching. The fabricated device showed polarization-electric field (P-E) hysteresis loop of piezoelectric PZT thin film and the deflection. Therefore, the realization of piezoelectric drive type deformable mirrors (DMs) using epitaxial PZT thin film can be expected.
外延PZT薄膜压电驱动型2轴倾斜控制装置的制作与评价
采用外延型Pb(Zr0.52, Ti0.48)O3 (PZT)薄膜在外延型γ-Al2O3/Si衬底上制备了压电驱动型2轴倾斜控制装置。在SrRuO3(111)/Pt(111)/ γ-Al2O3(111)/Si(111)外延衬底上溶胶-凝胶沉积了500 nm厚的PZT(111)外延薄膜,并通过XeF2气体刻蚀在驱动区形成了空心结构。制作的器件显示了压电PZT薄膜的极化电场(P-E)滞回线和偏转。因此,利用外延PZT薄膜实现压电驱动型变形镜(dm)是有希望的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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