Transverse line parameters of coupled microstrips on a lossy substrate

Abstract

This paper deals with the evaluation of the frequencydependent transverse line parameters C and G of coupled microstrips on a lossy substrate. The proposed full wave approach, combined with the use of the Neumann series, allows a simple and fast computing solution of the problem and accurately takes into account the proximity effect between the microstrips. The method can also be useful for the validation of simple closed-form expressions.