{"title":"On retrieval of permittivity profile","authors":"K. Gaikovich, I. Vorgul, M. Marciniak","doi":"10.1109/ICTON.2001.934759","DOIUrl":null,"url":null,"abstract":"A new theoretical approach is proposed for solving the inverse problem of dielectric permittivity retrieval by a reflected field. It is based on the approximate solution of an integral equation, obtained by combining the integral equation for the electromagnetic field inside the object with an integral expression, which determines the diffracted field in the external region after the field inside it. The solution method based on the Tichonoffs (1983) theory of ill-posed problems is proposed. Also a simple scheme for fast estimation of the object permittivity profile has been worked out.","PeriodicalId":301018,"journal":{"name":"Proceedings of 2001 3rd International Conference on Transparent Optical Networks (IEEE Cat. No.01EX488)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-06-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 2001 3rd International Conference on Transparent Optical Networks (IEEE Cat. No.01EX488)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICTON.2001.934759","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
A new theoretical approach is proposed for solving the inverse problem of dielectric permittivity retrieval by a reflected field. It is based on the approximate solution of an integral equation, obtained by combining the integral equation for the electromagnetic field inside the object with an integral expression, which determines the diffracted field in the external region after the field inside it. The solution method based on the Tichonoffs (1983) theory of ill-posed problems is proposed. Also a simple scheme for fast estimation of the object permittivity profile has been worked out.