Precise E-field measurement inside TEM cell at GSM frequencies using microstrip E-field probe

Abstract

A dual-band Electric (E-) field probe of 950MHz and 2.45GHz (bandwidth of 100MHz and 300MHz respectively) based on coplanar waveguide (CPW)-fed microstrip antenna is used to measure the E-field strength inside the transverse electromagnetic (TEM) cell. The paper discusses the design, optimization, fabrication and characterization of the E-field probe. Theoretical, simulated and measured E-field strength has been reported. For validation purpose, the results are compared against theoretical values and standard E-field probe and are found in agreement.