Testing Significance of Layout Dependent Impacts on Silicon Chips Performance

Abstract

Layout Dependent Effects (LDE) plays a vital role in layout of analog and digital circuits. These effects are directly affects the performance of the integrated circuits. If you did not pay any attention to the layout dependent effects, then there is a less chance to get the proper performance of the chips. There are many layout dependent effects such as Shallow Trench Isolation (STI), Length of Diffusion (LoD), Poly and Diffusion spacing, Well Proximity Effect (WPE) etc. In this paper, more attention is given to the above topics. Engineers typically must perform a variety of checks that cover these and related layout issues to ensure analog layout consistency.