M. Callieri, Paolo Cignoni, M. Dellepiane, Roberto Scopigno
{"title":"Pushing time-of-flight scanners to the limit","authors":"M. Callieri, Paolo Cignoni, M. Dellepiane, Roberto Scopigno","doi":"10.2312/VAST/VAST09/085-092","DOIUrl":null,"url":null,"abstract":"The paper describes a pipeline for 3D scanning acquisition and processing that allow to exploit the utmost precision and quality out of ToF scanners. The proposed approach capitalize on the knowledge of the distribution of the noise to apply sophisticated fairing techniques for cleaning up the data. Leveraging on the very dense sampling of this kind of scanners we show that is possible to attain high accuracy. We present a practical application of the proposed approach for the scanning of a large (5mt) statue with millimetric precision.","PeriodicalId":168094,"journal":{"name":"IEEE Conference on Visual Analytics Science and Technology","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"15","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Conference on Visual Analytics Science and Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.2312/VAST/VAST09/085-092","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 15
Abstract
The paper describes a pipeline for 3D scanning acquisition and processing that allow to exploit the utmost precision and quality out of ToF scanners. The proposed approach capitalize on the knowledge of the distribution of the noise to apply sophisticated fairing techniques for cleaning up the data. Leveraging on the very dense sampling of this kind of scanners we show that is possible to attain high accuracy. We present a practical application of the proposed approach for the scanning of a large (5mt) statue with millimetric precision.