{"title":"Low power testing - What can commercial DFT tools provide?","authors":"X. Lin","doi":"10.1109/IGCC.2011.6008609","DOIUrl":null,"url":null,"abstract":"Minimizing power consumption during functional operation and during manufacturing test has become one of the dominant requirements for the semiconductor designs in the past decade. From commercial DFT tool point of view, this paper describes the capabilities the DFT tools can provide to achieve comprehensive testing of low power designs as well as to reduce test power consumption during test application.","PeriodicalId":306876,"journal":{"name":"2011 International Green Computing Conference and Workshops","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 International Green Computing Conference and Workshops","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IGCC.2011.6008609","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Minimizing power consumption during functional operation and during manufacturing test has become one of the dominant requirements for the semiconductor designs in the past decade. From commercial DFT tool point of view, this paper describes the capabilities the DFT tools can provide to achieve comprehensive testing of low power designs as well as to reduce test power consumption during test application.