Double gate FinFET master slave Flip-Flop design for low power application

Ankur Gupta, S. Akashe
{"title":"Double gate FinFET master slave Flip-Flop design for low power application","authors":"Ankur Gupta, S. Akashe","doi":"10.1109/ICPCES.2014.7062822","DOIUrl":null,"url":null,"abstract":"In this paper, we are presenting various analyses on master slave D Flip-Flop which is designed using FinFET. Master Slave Flip-Flop is advanced version of Flip-flops. To make Master Slave Flip-Flop Normal Flip-Flop is followed by Clocked S-R Flip-Flop. According to Moore's law the no. of transistor in a meticulous chip area is two times in every 18 months. This announcement gives new age of VLSI meadow. If we want to increase the no. of component in chip area so we diminish the size of component. Appling this quality in chip component, the size of transistor reduced. As we scale down the device parameter after a certain rule, the short channel effects like leakage power, surface scattering, velocity saturations, takes place. Fin-FET is a superior device to eliminate or decrease above mentioned problems. We evaluate the various parameters like temperature effect to the total power, total power consumption, average DC power, calculation etc. For calculation of these results we are use cadence tools. After simulating the circuit we get values of Average DC power which is 160nW, Instantaneous Transient Power Consumption is 65.20nW, Delay is 30nS.","PeriodicalId":337074,"journal":{"name":"2014 International Conference on Power, Control and Embedded Systems (ICPCES)","volume":"227 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 International Conference on Power, Control and Embedded Systems (ICPCES)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICPCES.2014.7062822","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

In this paper, we are presenting various analyses on master slave D Flip-Flop which is designed using FinFET. Master Slave Flip-Flop is advanced version of Flip-flops. To make Master Slave Flip-Flop Normal Flip-Flop is followed by Clocked S-R Flip-Flop. According to Moore's law the no. of transistor in a meticulous chip area is two times in every 18 months. This announcement gives new age of VLSI meadow. If we want to increase the no. of component in chip area so we diminish the size of component. Appling this quality in chip component, the size of transistor reduced. As we scale down the device parameter after a certain rule, the short channel effects like leakage power, surface scattering, velocity saturations, takes place. Fin-FET is a superior device to eliminate or decrease above mentioned problems. We evaluate the various parameters like temperature effect to the total power, total power consumption, average DC power, calculation etc. For calculation of these results we are use cadence tools. After simulating the circuit we get values of Average DC power which is 160nW, Instantaneous Transient Power Consumption is 65.20nW, Delay is 30nS.
低功耗应用的双栅极FinFET主从触发器设计
本文介绍了利用FinFET设计的主从D触发器的各种分析。主从触发器是触发器的高级版本。为了使主从触发器正常触发器之后是时钟S-R触发器。根据摩尔定律。每18个月就会有两次晶体管在一个精密的芯片区域发生故障。这一公告标志着VLSI领域进入了一个新的时代。如果我们想增加no。在芯片面积上减小元件的尺寸。将这种品质应用于芯片元件,晶体管的尺寸减小了。当我们按一定规律缩小器件参数时,会出现漏功率、表面散射、速度饱和等短通道效应。翅片场效应管是消除或减少上述问题的优良器件。我们评估了温度对总功率、总功耗、平均直流功率、计算等各种参数的影响。为了计算这些结果,我们使用节奏工具。通过对电路的仿真,得到平均直流功率为160nW,瞬时暂态功耗为65.20nW,延时为30nS。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信