{"title":"A 0.05-mm2 110-μW 10-b self-calibrating successive approximation ADC core in 0.18-μm CMOS","authors":"Y. Kuramochi, A. Matsuzawa, M. Kawabata","doi":"10.1109/ASSCC.2007.4425771","DOIUrl":null,"url":null,"abstract":"We present a 10-bit 1-MS/s successive approximation analog-to-digital converter core including a charge redistribution digital-to-analog converter and a comparator. A new linearity calibration technique enables use of a nearly minimum capacitor limited by kT/C noise. The ADC core without digital blocks has been fabricated in a 0.18-mum CMOS process and consumes 110muW at 1.8 V power supply. With the calibration it achieves 9.0-dB improvement of SNDR and 23.3dB improvement of SFDR. The measured SNDR and SFDR are 51.1 dB and 69.8 dB respectively.","PeriodicalId":186095,"journal":{"name":"2007 IEEE Asian Solid-State Circuits Conference","volume":"90 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"24","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE Asian Solid-State Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASSCC.2007.4425771","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 24
Abstract
We present a 10-bit 1-MS/s successive approximation analog-to-digital converter core including a charge redistribution digital-to-analog converter and a comparator. A new linearity calibration technique enables use of a nearly minimum capacitor limited by kT/C noise. The ADC core without digital blocks has been fabricated in a 0.18-mum CMOS process and consumes 110muW at 1.8 V power supply. With the calibration it achieves 9.0-dB improvement of SNDR and 23.3dB improvement of SFDR. The measured SNDR and SFDR are 51.1 dB and 69.8 dB respectively.