The fine pitch direct bonding technology for chip interconnection

H. Tohyama, S. Ozawa, Y. Kitayama, T. Yamashita, Y. Nakamura
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引用次数: 2

Abstract

We have developed new direct bonding technology using anisotropic conductive film (ACF) connections between two chips. We applied this bonding technology in ultra fine pitch interconnections at 40 /spl mu/m between an LED array and a driver IC, and realized a minimized LED print head. The key point of direct bonding technology is assurance of connection reliability which can be improved by two important factors. One is the elastic recovery quantity of conductive particles between the connection electrodes, and the other is the adhesive strength of the chip bonding area. As a result of analysis with particular attention paid to these factors, we found two further features: (1) an elastic recovery quantity usually obtained by using soft conductive particles which was included in ACF, in the case of electrodes with variable form and hardness; (2) adhesive strength increased when accompanied with a rise in the curing temperature. We tested this technology by interconnection of 192 connection pads lined in 40 /spl mu/m pitch, and achieved good bonding reliability in temperature and relative humidity cycling tests. This new bonding technology is effective in ultra-fine pitch direct bonding, so that this technology can be widely applied to various types of device chip. In this paper, the details of the technology and the connection reliability are reported.
芯片互连的小间距直接键合技术
我们利用各向异性导电膜(ACF)连接两个芯片,开发了新的直接键合技术。我们将这种键合技术应用于LED阵列与驱动IC之间40 /spl μ m的超细间距互连,实现了LED打印头的最小化。直接连接技术的关键是保证连接的可靠性,而保证连接的可靠性可由两个重要因素来提高。一是连接电极间导电颗粒的弹性回复量,二是芯片粘接区域的粘接强度。通过对这些因素的特别分析,我们发现了两个进一步的特征:(1)在具有可变形状和硬度的电极的情况下,通常通过使用ACF中包含的软导电颗粒获得弹性恢复量;(2)随着固化温度的升高,粘接强度增大。通过以40 /spl mu/m间距为衬里的192个连接板的互连试验,在温度和相对湿度循环试验中取得了良好的连接可靠性。这种新型键合技术在超细间距直接键合中是有效的,从而使该技术可以广泛应用于各种类型的器件芯片。本文介绍了该技术的具体内容和连接可靠性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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