Fast Characterization of System Level ESD Noise Coupling to Real Motherboard in Notebook

Abstract

This work presents a method for the fast and efficient characterization of the system level electrostatic discharge (ESD) noise coupling to real portable computer (note-book) motherboard. The coupled noise to the commercial laptop motherboard, in both operational and non-operational conditions, is predicted in SPICE type circuit simulator using the derived coupling transfer impedance function from scattering (S) parameters. 8-parameters between the aggressor and victim positions are measured using the proposed different method, without any modification in ESD generator, for the calculation of the coupling transfer impedance function. A good degree of accuracy is observed between the time domain measured and simulated results using proposed method.