Investigation of Operating System Influence on Single Event Functional Interrupts Using Fault Injection and Hardware Error Detection in ARM Microcontroller

2021 International Siberian Conference on Control and Communications (SIBCON) Pub Date : 2021-05-13 DOI:10.1109/SIBCON50419.2021.9438916

I. Loskutov, N. D. Kravchenko, V. Marfin, P. V. Nekrasov, D. Bobrovsky, A. Smolin, A. Yanenko

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引用次数: 3

Abstract

the paper presents a broad investigation of single event effects in ARM microcontroller (MCU) under heavy ion irradiation. Experimental details are presented: device under the test and test setup. The stages of experiments are described: radiation testing using heavy ion accelerator, laser source irradiation and single event functional interrupts simulation campaign. The algorithm of operation of the program injector for conducting campaigns on simulating SEFI is presented. The influence of a real-time operating system on cross-section of SEFI was evaluated. SEFI cross-sections obtained with and without the operating system were compared. A method using fault injection in program and data memory and hardware detection of functional interrupts was tested. The results of SEFI simulation and calculation by engineering model were compared with experimental results. The results obtained differ from each other. Possible explanations of the proposed differences and the correction of the model are proposed. Directions for further research are outlined.

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基于ARM单片机故障注入和硬件错误检测的操作系统对单事件功能中断的影响研究

本文对ARM微控制器在重离子辐照下的单事件效应进行了广泛的研究。给出了实验细节:试验装置和试验装置。介绍了实验的三个阶段:重离子加速器辐射测试、激光源辐照和单事件功能中断模拟实验。给出了模拟SEFI运动的程序注入器的运行算法。评估了实时操作系统对SEFI横截面的影响。比较有和没有操作系统的SEFI横截面。测试了一种采用程序和数据存储器故障注入和硬件检测功能中断的方法。将工程模型模拟计算结果与实验结果进行了比较。所得结果各不相同。对提出的差异的可能解释和模型的修正提出了建议。展望了今后的研究方向。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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2021 International Siberian Conference on Control and Communications (SIBCON)

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