{"title":"Bulk charging of epoxy insulation under DC stress","authors":"C. W. Mangelsdorf, C. Cooke","doi":"10.1109/ICEI.1980.7470896","DOIUrl":null,"url":null,"abstract":"Stress enhancement due to the migration of charges can be a critical factor in the design of solid insulation for high voltage DC systems. The effect of bulk currents on surface and internal charge accumulation is discussed; and equations are formulated which predict steady-state conditions in arbitrary configurations o Experimental evidence is given for the validity of this analysis in epoxy insulators.","PeriodicalId":113059,"journal":{"name":"1980 IEEE International Conference on Electrical Insulation","volume":"44 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1980-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"55","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1980 IEEE International Conference on Electrical Insulation","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEI.1980.7470896","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 55
Abstract
Stress enhancement due to the migration of charges can be a critical factor in the design of solid insulation for high voltage DC systems. The effect of bulk currents on surface and internal charge accumulation is discussed; and equations are formulated which predict steady-state conditions in arbitrary configurations o Experimental evidence is given for the validity of this analysis in epoxy insulators.