{"title":"Degradation Reliability Modeling for Nonlinearly Recoverable Products Under Random Shock","authors":"Li Min, Wang Zhihua, Ren Jie, Wu Bo","doi":"10.1109/SRSE54209.2021.00012","DOIUrl":null,"url":null,"abstract":"A significant of degradation equipment nonlinearly recovers after shock loads in long-term operation, making the total degradation complicated. However, the total degradation cannot be appropriately described by exiting models, which will further obstruct accurate life prediction. In view of the features of nonlinear recovery phenomenon including the nonlinear character, recoverable level and recovery period, this paper constructs a degradation reliability model to depict the total degradation process composed of shock damages with nonlinear recovery regularity and continuous degradation. Then a maximum likelihood parameter estimation method is presented. Finally, the reasonability and effectiveness of the proposed model are verified by the numerical example of semiconductor laser diodes. The results demonstrate the necessity of nonlinear recovery process in the total degradation modeling to obtain precise reliability analysis and life prediction consequences.","PeriodicalId":168429,"journal":{"name":"2021 3rd International Conference on System Reliability and Safety Engineering (SRSE)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 3rd International Conference on System Reliability and Safety Engineering (SRSE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SRSE54209.2021.00012","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A significant of degradation equipment nonlinearly recovers after shock loads in long-term operation, making the total degradation complicated. However, the total degradation cannot be appropriately described by exiting models, which will further obstruct accurate life prediction. In view of the features of nonlinear recovery phenomenon including the nonlinear character, recoverable level and recovery period, this paper constructs a degradation reliability model to depict the total degradation process composed of shock damages with nonlinear recovery regularity and continuous degradation. Then a maximum likelihood parameter estimation method is presented. Finally, the reasonability and effectiveness of the proposed model are verified by the numerical example of semiconductor laser diodes. The results demonstrate the necessity of nonlinear recovery process in the total degradation modeling to obtain precise reliability analysis and life prediction consequences.