Impact of leakage and short circuit current in rush current analysis of power gated domains

Abstract

Power shut off being a key technique for power reduction in today's designs, it is critical to be able to verify circuit behavior when it is powered from an off state to an on state. The total rush current and turn-on time of the module can be impacted by the high short circuit current caused by slow signal slew rates and the leakage current of the module. In this paper, we present a study on how these effects impact the overall analysis and how they can be accounted for during a power-up analysis. The analysis has been done on ARM 968 processor based Wireless LAN IC.