Structural, Electronic & Magnetic Properties of Pristine and Defected ZnO Monolayer: First-Principles Study

H. K. Neupane, A. Rijal, N. Adhikari, Dr. Hom Bahadur Baniya, Prof. Dr. Bhawani Datta, J. Sanju, Shrestha Dr. Niraj, Dhital Dr. Dinesh, Acharya Dr. Shashit, Kumar Yadav Dr, R. P. Guragain
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Abstract

Electronic and magnetic properties of materials are appealing properties and have budding applications in the devices. In this work, we have investigated the structural, electronic and magnetic properties of pristine Zinc-Oxide (ZnO) and Oxygen-defected Zinc-Oxide (ZnO_O) materials by spin-polarized density functional theory (DFT) method. Structural properties are studied by calculating their total ground state energy, and found that both are stable 2D materials. It is also found that ZnO have higher stability than of ZnO_O material. Electronic properties of considered materials are examined by analyzing of their band structure, density of states (DOS) calculations and found that ZnO is a direct band gap, n-type semiconductor material in its pristine form and an indirect band gap, p-type semiconductor material in its Oxygen-defected form (ZnO_O). Magnetic properties of pristine and defected ZnO are investigated by analyzing their density of states (DOS) and partial density of states (PDOS) calculations, they revealed that ZnO and ZnO_O have non-magnetic properties.
原始和缺陷ZnO单层的结构、电子和磁性能:第一性原理研究
材料的电子和磁性是吸引人的特性,在器件中有初步的应用。在这项工作中,我们用自旋极化密度泛函理论(DFT)方法研究了原始氧化锌(ZnO)和氧缺陷氧化锌(ZnO_O)材料的结构、电子和磁性能。通过计算它们的总基态能量,研究了它们的结构性质,发现它们都是稳定的二维材料。ZnO的稳定性也高于ZnO_O材料。通过分析所考虑的材料的能带结构和态密度(DOS)计算来检查其电子性能,发现ZnO在其原始形态下是直接带隙n型半导体材料,而在其氧缺陷形态(ZnO_O)下是间接带隙p型半导体材料。通过分析ZnO的态密度(DOS)和偏态密度(PDOS)计算,研究了ZnO和ZnO_O的磁性能,发现ZnO和ZnO_O具有非磁性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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