A study on the portability of CTRON FTAM-CCL and CMISE-CCL interfaces

Abstract

The CTRON technical committee has planned serveral CTRON portability evaluation tests. The CTRON portability experiment step 2 concentrates on layer 3, layers 4/5, FTAM, and CMISE. The authors give an overview of FTAM and CMISE tests. The portability of FTAM and CMISE interfaces is evaluated by examining problems, time taken, and source code modification required for porting them from their original CTRON basic operating systems to another CTRON basic operating system. The results confirm that the protocol parts of FTAM and CMISE have high portability.<>