Direct power injection (DPI) simulation framework and postprocessing

Abstract

This paper deals with direct power injection (DPI) simulations and it focuses on the simulation framework and post processing strategies to be performed during the design phase of automotive integrated circuits (ICs). The aim of such susceptibility simulations is to assist a designer to predict the ICs susceptibility to radio frequency interferences (RFI) during the design phase of the IC. For this purpose a complete DPI simulation model according to the standardized DPI measurement setup is introduced. Based on a simple example the methodology and several DPI simulation results are shown together with possible post processing strategies.