Y. Tretiakov, R. Groves, J. Rascoe, C. Mathis, B. Foley
{"title":"Improved modeling accuracy of thick metal passive SiGe/BiCMOS components for UWB using ADS momentum","authors":"Y. Tretiakov, R. Groves, J. Rascoe, C. Mathis, B. Foley","doi":"10.1109/RFIC.2004.1320653","DOIUrl":null,"url":null,"abstract":"This paper demonstrates the use of ADS Momentum to model spiral and straight line inductors for ultra wide band (UWB) applications over a silicon substrate. The main focus is on the improvements in the most recent version of the Advanced-Design System (ADS 2003C), which employs a new algorithm to model metal thickness. Results for two different inductor topologies show the increased accuracy of using a thick metal approach, versus that of sheet conductors, when compared to measured test site data.","PeriodicalId":140604,"journal":{"name":"2004 IEE Radio Frequency Integrated Circuits (RFIC) Systems. Digest of Papers","volume":"47 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2004 IEE Radio Frequency Integrated Circuits (RFIC) Systems. Digest of Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RFIC.2004.1320653","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10
Abstract
This paper demonstrates the use of ADS Momentum to model spiral and straight line inductors for ultra wide band (UWB) applications over a silicon substrate. The main focus is on the improvements in the most recent version of the Advanced-Design System (ADS 2003C), which employs a new algorithm to model metal thickness. Results for two different inductor topologies show the increased accuracy of using a thick metal approach, versus that of sheet conductors, when compared to measured test site data.