J. Lacord, M. Parihar, C. Navarro, François Tcheme Wakam, M. Bawedin, S. Cristoloveanu, F. Gamiz, J. Barbe
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引用次数: 7
Abstract
In this study, we propose a benchmark of performance between three promising 1T-DRAM device structures on SOI substrate: MSDRAM, A2RAM and $\mathrm{Z}^{2} -$FET. For a fair comparison, TCAD simulation with the same basic calibration and typical 28FDSOI technological parameters was used. The merits and limitations of each variant are discussed.