ORIGIN OF NANOSTRUCTURES IN SULPHIDE AND SELENIDE GLASSES

Abstract

Based on radiography data, the X-ray scattering curves of HgX-GeX 2 (X-S, Se) X-ray alloys were compared with the diffraction patterns of polycrystalline Hg 2 GeSe 4 (Hg 4 GeS 6 ) alloys. In the amorphous matrix of the alloy based on compounds Hg 2 GeSe 4 for selenide and Hg 4 GeS 6 for sulfide systems dispersed inhomogeneities. For the selenide system, the size of the inhomogeneities is about 5 nm.