R. Ryter, R. Zingg, C. Hegarty, W. Fichtner, E. Doering
{"title":"Integrated BiCMOS process and circuit development using SPR","authors":"R. Ryter, R. Zingg, C. Hegarty, W. Fichtner, E. Doering","doi":"10.1109/IEMT.1993.398216","DOIUrl":null,"url":null,"abstract":"An integrated process development environment is described. Geometry information for process simulation is taken automatically from a commercial layout tool, and process step information exists in a high-level language databank. Doping information can be read by a device simulator, permitting SPICE (simulation program with IC emphasis)-like circuit simulation. This environment is presented in a BiCMOS development context.<<ETX>>","PeriodicalId":206206,"journal":{"name":"Proceedings of 15th IEEE/CHMT International Electronic Manufacturing Technology Symposium","volume":"142 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-10-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 15th IEEE/CHMT International Electronic Manufacturing Technology Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.1993.398216","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
An integrated process development environment is described. Geometry information for process simulation is taken automatically from a commercial layout tool, and process step information exists in a high-level language databank. Doping information can be read by a device simulator, permitting SPICE (simulation program with IC emphasis)-like circuit simulation. This environment is presented in a BiCMOS development context.<>