GSS (Gated-Short-Short) Calibration for Free-space Material Measurements in millimeter-Wave Frequency Band

Abstract

Electrical properties of materials are requisite to design electromagnetic (EM) devices and systems. Free-space material measurement method, where the measurands are the free-space scattering parameters of MUT (Material Under Test) located at the middle of transmit (Tx)/receive (Rx) antennas, is suitable for non-destructively testing MUT without prior machining and physical contact in high frequencies. In this paper, GSS (Gated-Short-Short) calibration method using a planar offset short is proposed for calibrating a free-space material measurement system and the measurement result is shown in W-band (75–110 GHz).