Sampling iso-functional signal switches in library circuits for microelectronics verification with topological constraints

L. A. Hsia, G. Vernizzi, M. Lanzerotti, D. Langley
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Abstract

This paper extends a methodology for microelectronics verification to the situation in which signal switches are applied to library circuits containing INV, NAND2, NOR2, NAND3, and NOR3 gates. Monte Carlo methods are used to sample the frequency distributions of the topological genus of library circuits including a 4-bit adder.
带拓扑约束的微电子验证库电路中的采样等功能信号开关
本文将微电子验证方法扩展到信号开关应用于包含INV, NAND2, NOR2, NAND3和NOR3门的库电路的情况。采用蒙特卡罗方法对包含4位加法器的库电路的拓扑格的频率分布进行了采样。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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