Light scattering from silicon nitride microdisks

D. McCloskey, J. Donegan
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Abstract

High intensity sub-wavelength spots and low divergence nanojets are observed in a system of Si3N4 microdisks illuminated from the side with laser light of wavelengths 532 nm and 633 nm. The disks are of height 400 nm with diameters ranging from 1μm to 10 μm. Light scattered from the disk and substrate is observed by imaging from above. In free space light is focused inside the disks and a sub wavelength spot is observed, whereas in water the refractive index contrast is such that photonic nanojets are formed. The angular distribution of the intensity compares well to the analytical solution for the case of an infinite cylinder. The diameter dependence of the scattering is explored and matches well with theory.
氮化硅微盘的光散射
用波长分别为532 nm和633 nm的激光从侧面照射Si3N4微盘,观察到高强度的亚波长光斑和低发散纳米射流。磁盘高度为400nm,直径为1μm ~ 10 μm。从上面成像可以观察到从圆盘和基片散射的光。在自由空间中,光被聚焦在圆盘内部,观察到一个亚波长光斑,而在水中,折射率对比是这样的,光子纳米射流形成。强度的角分布与无限圆柱情况下的解析解比较好。对散射的直径依赖性进行了研究,结果与理论吻合良好。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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