Mechanical Characterization of SAC305 and SnPb36Ag2 BGA Assemblies Under Static Flexural Loading

J. Libot, O. Dalverny, J. Alexis, Jeremy Bosq
{"title":"Mechanical Characterization of SAC305 and SnPb36Ag2 BGA Assemblies Under Static Flexural Loading","authors":"J. Libot, O. Dalverny, J. Alexis, Jeremy Bosq","doi":"10.37665/smt.v36i1.34","DOIUrl":null,"url":null,"abstract":"Static bending-induced solder joints damage is a main reliability concern for aerospace and military industries whose Printed Circuit Board Assemblies (PCBAs) are required to remain functional under flexural loading. In order to dissipate heat in an equipment, it is common to install thermal gap pads on electronic packages. When compressing thermal gap pads during the fixture process, the PCBA can bend and solder joints can therefore crack if the deflection is too important. This paper reports the durability of 96.5Sn-3.0Ag-0.5Cu (SAC305) and 62Sn-36Pb-2Ag (SnPb36Ag2) Ball Grid Array (BGA) assemblies under static flexural loading at -55°C, 20°C and 125°C. As electronic equipment can be stored at high temperature for prolonged durations, some SAC305 test vehicles were also aged at 125°C for 192 hours. For each test configuration, the bending tests were conducted at a ramp-rate of 2 mm/min and the central displacement-to-failure was measured. Finite Element Modeling (FEM) analysis was conducted considering a global-local approach and the transfer function between the central displacement-to-failure and the local PCB strain near the critical solder joints was determined for each test configuration. The results give the necessary data for designers to assess whether a specific PCBA design subjected to static bending is at risk or not.","PeriodicalId":118222,"journal":{"name":"Journal of Surface Mount Technology","volume":"86 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-03-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Surface Mount Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.37665/smt.v36i1.34","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

Static bending-induced solder joints damage is a main reliability concern for aerospace and military industries whose Printed Circuit Board Assemblies (PCBAs) are required to remain functional under flexural loading. In order to dissipate heat in an equipment, it is common to install thermal gap pads on electronic packages. When compressing thermal gap pads during the fixture process, the PCBA can bend and solder joints can therefore crack if the deflection is too important. This paper reports the durability of 96.5Sn-3.0Ag-0.5Cu (SAC305) and 62Sn-36Pb-2Ag (SnPb36Ag2) Ball Grid Array (BGA) assemblies under static flexural loading at -55°C, 20°C and 125°C. As electronic equipment can be stored at high temperature for prolonged durations, some SAC305 test vehicles were also aged at 125°C for 192 hours. For each test configuration, the bending tests were conducted at a ramp-rate of 2 mm/min and the central displacement-to-failure was measured. Finite Element Modeling (FEM) analysis was conducted considering a global-local approach and the transfer function between the central displacement-to-failure and the local PCB strain near the critical solder joints was determined for each test configuration. The results give the necessary data for designers to assess whether a specific PCBA design subjected to static bending is at risk or not.
静态弯曲载荷下SAC305和SnPb36Ag2 BGA组件的力学特性
静电弯曲引起的焊点损坏是航空航天和军事工业的主要可靠性问题,其印刷电路板组件(pcba)需要在弯曲载荷下保持功能。为了在设备中散热,通常在电子封装上安装热隙垫。当在夹具过程中压缩热间隙垫时,PCBA可能弯曲,如果偏转太重要,焊点可能因此破裂。本文报道了96.5Sn-3.0Ag-0.5Cu (SAC305)和62Sn-36Pb-2Ag (SnPb36Ag2)球栅阵列(BGA)组件在-55°C、20°C和125°C静态弯曲载荷下的耐久性。由于电子设备可以在高温下长时间储存,一些SAC305测试车辆也在125°C下老化192小时。对于每种测试配置,弯曲测试以2 mm/min的斜坡速率进行,并测量中心位移到破坏。采用全局-局部方法进行有限元建模(FEM)分析,确定了每种测试配置下关键焊点附近的中心位移-失效与局部PCB应变之间的传递函数。结果为设计师提供了必要的数据,以评估特定的PCBA设计是否受到静态弯曲的风险。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信