Performance enhancement of junctionless nanowire FET with laterally graded channel doping and high-K spacers

S. Sharma, B. Raj, M. Khosla
{"title":"Performance enhancement of junctionless nanowire FET with laterally graded channel doping and high-K spacers","authors":"S. Sharma, B. Raj, M. Khosla","doi":"10.1109/GCCE.2015.7398608","DOIUrl":null,"url":null,"abstract":"We propose the use of laterally graded channel doping and High-K Spacers positioned on both sides of gate oxide to improve the Performance and thereby, the scalability of Junctionless Nanowire Field Effect Transistors (JLNWFET). The performance parameters of the device considered in this study are ION/IOFF ratio, Drain-Induced Barrier Lowering (DIBL) and Sub Threshold Slope (SS). Using extensive 3-D TCAD simulations, we have analyzed that the OFF-state leakage, DIBL and SS can be reduced owing to the combined use of laterally graded-doping channel and High-k Spacers.","PeriodicalId":363743,"journal":{"name":"2015 IEEE 4th Global Conference on Consumer Electronics (GCCE)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE 4th Global Conference on Consumer Electronics (GCCE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/GCCE.2015.7398608","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

Abstract

We propose the use of laterally graded channel doping and High-K Spacers positioned on both sides of gate oxide to improve the Performance and thereby, the scalability of Junctionless Nanowire Field Effect Transistors (JLNWFET). The performance parameters of the device considered in this study are ION/IOFF ratio, Drain-Induced Barrier Lowering (DIBL) and Sub Threshold Slope (SS). Using extensive 3-D TCAD simulations, we have analyzed that the OFF-state leakage, DIBL and SS can be reduced owing to the combined use of laterally graded-doping channel and High-k Spacers.
用横向梯度通道掺杂和高k间隔层增强无结纳米线场效应管的性能
我们建议使用横向梯度通道掺杂和位于栅氧化物两侧的高k间隔层来提高性能,从而提高无结纳米线场效应晶体管(JLNWFET)的可扩展性。本研究考虑的器件性能参数为离子/IOFF比、漏导势垒降低(DIBL)和亚阈值斜率(SS)。通过广泛的三维TCAD模拟,我们分析了由于横向分级掺杂通道和高k间隔层的结合使用,可以减少off状态泄漏、DIBL和SS。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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