Digital Circuit Testing on a Network of Workstations

Abstract

This paper presents preliminary results of research being conducted in the application of distributed/parallel algorithms to automatic test pattern generation for synchronous sequential circuits. The system is required to be portable across a wide variety of architectures -from workstations to dedicated parallel machines. This requirement necessitates the use of a parallel programming environment that provides a layer of abstraction between the application and the hardware. The first phase of the proposed system involves generation of circuit covers - input patterns that control the circuit outputs.