{"title":"Techniques and Measures to Manage Functional Safety and Other Risks with Regard to Electromagnetic Disturbances","authors":"K. Armstrong","doi":"10.1109/GEMCCON.2018.8628478","DOIUrl":null,"url":null,"abstract":"Many near-future applications necessary for the safety and quality of human life, will require a huge expansion in high-per-formance high-power computing; switching power conversion; wireless datacommunications, and wireless power transfer. Electromagnetic interference (EMI) is often ignored at present but will be crucial for the arrival of this future world. Where errors, malfunctions or failures in electronic systems can increase safety or other risks, electromagnetic compatibility (EMC) testing cannot be sufficient for proving that risks are low enough. This paper briefly introduces newly-developed techniques and measures which, when added to traditional EMC testing, can prove that risks due to EMI are adequately low.","PeriodicalId":394870,"journal":{"name":"2018 IEEE 4th Global Electromagnetic Compatibility Conference (GEMCCON)","volume":"78 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE 4th Global Electromagnetic Compatibility Conference (GEMCCON)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/GEMCCON.2018.8628478","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8
Abstract
Many near-future applications necessary for the safety and quality of human life, will require a huge expansion in high-per-formance high-power computing; switching power conversion; wireless datacommunications, and wireless power transfer. Electromagnetic interference (EMI) is often ignored at present but will be crucial for the arrival of this future world. Where errors, malfunctions or failures in electronic systems can increase safety or other risks, electromagnetic compatibility (EMC) testing cannot be sufficient for proving that risks are low enough. This paper briefly introduces newly-developed techniques and measures which, when added to traditional EMC testing, can prove that risks due to EMI are adequately low.