Broadband kinetic inductance detectors for far-IR observations

J. Wheeler, J. Austermann, M. Vissers, J. Beall, Jiansong Gao, J. Imrek, E. Heilweil, D. Bennett, J. Gard, J. van Lanen, J. Hubmayr, J. Ullom
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Abstract

The development of direct absorbing kinetic inductance detectors (KIDs) for broadband far-infrared (FIR) observations designed to meet the needs of present and future telescopes is presented. This development was initiated to investigate the potential for upgrading the High-resolution Airborne Wideband Camera Plus (HAWC+) instrument on the Stratospheric Observatory for Infrared Astronomy (SOFIA) with KIDs; but also has applications generally for FIR detectors. These detectors consist of backside-illuminated KIDs on a silicon substrate where the hybrid TiN/Al inductor forms a resistive wire grid with broadband absorption. Detectors can be configured to absorb in either one or two polarizations with a pixel filling factor of around 80%. A novel two-layer meta material anti-reflection coating, and a sub-quarter-wavelength backshort allow for greater than 85% detection efficiency over the ultra-wide 1 to 6 THz bandwidth. These detectors require no focal plane focusing optics such as feedhorns or microlenses, do not require fragile membranes, and utilize proven and straightforward fabrication methods. The optical and microwave design of these detectors is presented. Additionally, the performance of test devices is quantified. This includes measurements of the AR coating effectiveness, detector noise equivalent powers, and detector internal quality factors under the relevant loading levels for the HAWC+ instrument. This information is used to assess the potential benefit of upgrading the HAWC+ instrument with these new detectors and to determine the applicability of this technology for other future FIR detectors.
用于远红外观测的宽带动态电感探测器
介绍了用于宽带远红外(FIR)观测的直接吸收动力电感探测器(KIDs)的研制,以满足当前和未来望远镜的需要。这一发展是为了研究用KIDs升级平流层红外天文观测台(SOFIA)上的高分辨率机载宽带相机(HAWC+)仪器的潜力;但也适用于FIR探测器。这些探测器由硅衬底上的反向照明KIDs组成,其中混合TiN/Al电感形成具有宽带吸收的电阻线栅。检测器可以配置为在一个或两个偏振中吸收,像素填充系数约为80%。一种新型的两层元材料抗反射涂层和亚四分之一波长背短允许在超宽的1到6太赫兹带宽内实现超过85%的检测效率。这些探测器不需要焦平面聚焦光学器件,如馈角或微透镜,不需要脆弱的膜,并利用成熟和直接的制造方法。介绍了这些探测器的光学和微波设计。此外,还对测试设备的性能进行了量化。这包括在HAWC+仪器的相关负载水平下测量AR涂层有效性、探测器噪声等效功率和探测器内部质量因子。这些信息用于评估用这些新探测器升级HAWC+仪器的潜在好处,并确定该技术对其他未来FIR探测器的适用性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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